The CHIPS Metrology Program at the National Institute of Standards and Technology (NIST) seeks a postdoctoral researcher motivated to improve the accuracy of nanoscale feature measurement using scanning electron microscopy (SEM). This is your opportunity to improve the accuracy of scanning electron microscopy (SEM) measurements. Accurate measurements by SEM require modeling the physics of signal production in the sample. Our team uses an SEM simulator to interpret signals. We seek measurement ...
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